MCP General Operating and Characteristics
  1. A.S. Tremsin, J.F. Pearson, G.W. Frasera, W.B. Feller, P. White, Microchannel plate operation at high count rates
  2. A.S. Tremsin and O.H.W. Siegmund, Charge Cloud Asymmetry in Detectors with Biased MCPs
  3. A.S. Tremin, J.V. Vallerga, and O.H.W. Siegmund Detector walk in position-sensitive detectors with biased microchannel plates
  4. A.S. Tremsin, J.V. Vallerga, and O.H.W. Siegmund Image translational shifts in microchannel plate detectors due to the presence of MCP channel bias; Nucl Instr Meth A477 (2002), 262.

Aging, Scrubbing, Lifetime
  1. O.H.W. Siegmund Preconditioning of MicroChannel Plate Stacks
  2. O.H.W. Siegmund Short section of spie4854 on scrubbing
  3. B. Pracek and M. Kern, ASS70, 169 (1992) AES studies of active intrachannel surface in microchannel plates
  4. B. Pracek, Vacuum, 43, 949(1992) AES studies of the active surface in MCP channels
  5. S. Kulov, S. Kesaev, I. Bugulova, Ju. Pergamentsev, V. Boyadjidy, et al., Quality of microchannel plate working surfaces, 2022
Fabrication Methods and Hermetic Sealing
  1. D. Ferenc, A. Chang, et al. Vacuum Sealing of Flat Panel Detectors
Atomic Layer Deposition
  1. J. Elam, D. Routkevitch, S. George; Properties of ZnO-Al2O3 Alloy Films Grown Using Atomic Layer Deposition Techniques
  2. ANL Energy_Systems Overview of ALD and Table of ALD Thin Materials
Resistive Layer
  1. A. Janotti and C.G. Van de Walle, "Fundamentals of Zinc Oxide as a Semiconductor," Rep. Prog. Phys. V72, p.126501 (2009) (PDF)
  1. CERN Hybrid PMT Fabrication
  2. PDP Low T Glass Frit Sealing
End Spoiling and Anode Gap
  1. Influence of the MCP and Anode Gap Parameters on the Spatial Resolution of an Image Intensifier
  2. Notes on Electrode Coating- Jeff Elam, Anil Mane, Qing Peng, Joe Libera
  3. MCP Electrodes and End Spoiling, Jeff Elam, Qing Peng, Anil Mane, Thomas Prolier, Joe Libera, Oct. 15, 2009
Fabrication Methods and Hermetic Sealing
  1. D. Ferenc, A. Chang, et al. Vacuum Sealing of Flat Panel Detectors