MCP General Operating and Characteristics
- A.S. Tremsin, J.F. Pearson, G.W. Frasera, W.B. Feller, P. White,
Microchannel plate operation at high count rates
- A.S. Tremsin and O.H.W. Siegmund, Charge Cloud
Asymmetry in Detectors with Biased MCPs
- A.S. Tremin, J.V. Vallerga, and O.H.W. Siegmund Detector walk in position-sensitive detectors with biased microchannel plates
- A.S. Tremsin, J.V. Vallerga, and O.H.W. Siegmund
Image translational shifts in microchannel plate detectors due
to the presence of MCP channel bias; Nucl Instr Meth A477 (2002), 262.
Aging, Scrubbing, Lifetime
- O.H.W. Siegmund Preconditioning of MicroChannel Plate Stacks
- O.H.W. Siegmund Short section of spie4854 on scrubbing
- B. Pracek and M. Kern, ASS70, 169 (1992)
AES studies of active intrachannel surface in microchannel plates
- B. Pracek, Vacuum, 43, 949(1992)
AES studies of the active surface in MCP channels
- S. Kulov, S. Kesaev, I. Bugulova, Ju. Pergamentsev, V. Boyadjidy, et al., Quality of microchannel plate working surfaces, 2022
Fabrication Methods and Hermetic Sealing
-
D. Ferenc, A. Chang, et al. Vacuum Sealing of Flat Panel Detectors
Atomic Layer Deposition
- J. Elam, D. Routkevitch, S. George; Properties of ZnO-Al2O3
Alloy Films Grown Using Atomic Layer Deposition Techniques
- ANL Energy_Systems Overview of ALD and Table of ALD Thin Materials
Resistive Layer
- A. Janotti and C.G. Van de Walle, "Fundamentals of Zinc Oxide as a Semiconductor," Rep. Prog. Phys. V72, p.126501 (2009) (PDF)
- CERN Hybrid PMT Fabrication
-
PDP Low T Glass Frit Sealing
End Spoiling and Anode Gap
- Influence of the MCP and Anode Gap Parameters on the Spatial Resolution of an Image Intensifier
- Notes on Electrode Coating- Jeff Elam, Anil Mane, Qing Peng, Joe Libera
- MCP Electrodes and End Spoiling, Jeff Elam, Qing Peng, Anil Mane, Thomas Prolier, Joe Libera, Oct. 15, 2009
Fabrication Methods and Hermetic Sealing
-
D. Ferenc, A. Chang, et al. Vacuum Sealing of Flat Panel Detectors